USP中SEM附录SCANNING ELECTRON MICROSCOPY

仪器资料 · 发表于 2019-3-20 06:18:41

Scanning electron microscopy (SEM) is an electron optical imaging technique that yields both topographic images and elemental information when used in conjunction with energy-dispersive X-ray analysis (EDX) or wavelength-dispersive X-ray spectrometry (WDS). SEM is useful for characterizing the size and morphology of microscopic specimens. Together, image and X-ray analyses are important for the identification of small particles. Elemental analyses using SEM/EDX or SEM/WDS are useful for qualitative and semiquantitative determination of elemental content. Accurate quantitation is possible only for bulk samples with smooth surfaces and thus is not practical for particle specimens.